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UFO Probe® card – new test card for PIC wafer testing
Photonic Integrated Circuits (PICs) are the chips of the future. Integrated photonics use light instead of electricity for data and signal processing.
Speed up the world

UFO Probe® Technology keeps you one step ahead
A step ahead with Jenoptik

New Jenoptik UFO Probe® Vertical

The consistent further development of the patented technology expands the possibilities of optical coupling and, with the new UFO Probe® Vertical version, enables parallel functional tests of optical as well as electrical components on chips using vertical needle technology from established test card manufacturers. This allows the user to couple up to 32 optical channels in parallel as standard - or more if required - without the need for active alignment.
Opto-electronics tests with high throughputs:
- Covers the entire wavelength range from 1260 to 1625 nanometres used in the telecommunications and data communications sector
- Provides polarization preservation for individual or all optical channels
- Contacting of up to 6000 bond pads/ of bondpads with dimensions down to 35 microns (depending on the needle type, even more)
- Also possible solder bumps and copper pillars
- Smallest addressable pitch of the electrical contacts in the range of 40 to 80 micro
- Lower and more uniform contact resistance in the range of 0.2 to 1.0 ohms (depending on the probe type)
For more technical details and specifications check out the datasheet here.
Have a closer look to the UFO Probe® Vertical

All benefits of the Probe Card Technology on one view
Progress
The PIC ecosystem can be expanded thanks to an efficient test method for high-throughput serial production; and the test time is reduced thanks to parallel qualification of multiple chips.
Innovation
The only commercial test solution for high-volume production that can run on standard test equipment.
Quality
Scrap is identified at an early stage of production for improved yield: All testing of all PICs can be carried out on a wafer.
Plug and Play
It is designed to operate in standard IC testers and automated testers. Low outlay and commissioning costs.
Efficiency
Fault parts are identified early on for increased yield and optimized production flow.
Flexibility
The pitch and number of optical I/O channels can be configured to suit you.
Enabling optical data communication

Probe card applications now and in the future
They can easily be integrated into existing test infrastructure

Detailed view of a built-in probe card
Combination of novel optical concept and proven needle technology
- Monolithic optical module
- Alignment-insensitive optical coupling for vertically emitting PICs
- Simultaneous optical and electrical scanning
- Optical concept compensates prober alignment tolerances
- Use of proven needle technology (partnership with test card manufacturers)
- Standard interface to wafer prober can be implemented
Technical details of the UFO Probe® optoelectronic card
Specifications | Current generation | Future generations |
---|---|---|
Component to be tested | Electronic and photonic integrated circuit (EPIC); optical transceivers for data transmission and telecommunications applications | EPIC for transceivers, photodiodes, |
Electric needle technology | Cantilever and Vertical | Cantilever, vertical/advanced |
Optical coupling principle DUT | Vertical coupling | Vertical coupling |
Number of optical inputs/outputs (OI/OO) | Up to 32 or more | <200 |
Pitch OI/OO | 127 μm, 250 μm, flexible for >250 μm | flexible |
Layout configuration of OI/OO arrays | Linear arrangement with same direction of inputs/outputs | Configurable to own needs |
Coupling angle | 0° and 11.6° standard, up to 20° customized | 0° - 20° |
Supported wavelength | 1260 - 1625 nm (O/ L-band) | VIS to NIR (U-band) |
Measurement of insertion loss | Repeatability: ~ 0.3 – 0.5 dB | Repeatability target: 0.1 dB |
RF measurement | Up to 110 GHz, depending on needle technology | GHz |
Interfaces | Eurocard format; ATE* | Eurocard format; |
Detailed Product Information

Awarded! Thuringia Innovation Award 2022 for UFO Probe® card
Jenoptik was awarded the Thuringia Innovation Award 2022 in the "Industry & Materials" category on November 30, 2022 in Weimar, Thuringia for its novel opto-electronic probe card for testing PIC wafers. Not quite 100 applications were received by STIFT Thüringen this year. Jenoptik convinced the expert jury with its well-thought-out approach to solving the increasing demand for photonic technologies in the electronics and semiconductor industry.