Jenoptik equips the Czech Metrology Institute with contour measurement technology

Jenoptik has had for many years a strong metrology partnership with the Český Metrologický Institute (CMI), among others for the calibration of metrological references, so-called standards. The CMI already uses two Jenoptik Waveline T8000R systems for the calibration of roughness standards. In spring 2019, the CMI had ordered a Waveline W900C contour measuring system from Jenoptik in order to calibrate contour standards in the future, too.

Launched by Jenoptik in 2019, the Waveline W900 measuring system together with the Waveline W800 series replaces the previous Waveline T series. Depending on the model, it can be used for roughness measurement, contour measurement or as an RC version for both. With an axis speed that is six times faster and a 30 percent improvement in background noise, Waveline W900 features a significantly faster measuring speed and higher measuring accuracy than its predecessors. In addition, its modular design allows for easy extension at any time.

In summer, the machine was inspected and approved in Villingen-Schwenningen, Germany, to a CMI employee and Ivan Moltas, Managing Director of HOMMEL CS s.r.o. in Teplice, who both travelled to Germany on that occasion. The metrology system passed all tests with flying colors and has since been delivered to CMI in the Czech Republic.

Jiri Borovsky, head of the calibration department at CMI, was visibly enthusiastic about the new W900: “The device is significantly better than its predecessor. It offers a lot more measuring possibilities, it is easier to operate and in the first tests it has already delivered more stable and accurate results than the T8000.”

The CMI is the national metrology standards body in the Czech Republic, thus the country’s highest authority for all questions of correct measurement, comparable with the Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig, Germany. The institute is also responsible for the calibration of standards.

Picture: On June 19, 2019, Jiri Borovsky, measurement technician from CMI in Brno (left), together with Ivan Moltas, Managing Director of Jenoptik's Czech representative Hommel CS s.r.o., visited Jenoptik’s metrology plant in Villingen-Schwenningen. The focus was on the acceptance of the Waveline W900 measuring system with nanoscantaster. There was also time for a factory tour.

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